HiRel Solid State Relays

 

IR HiRel’s solid state relay (SSR) portfolio includes radiation-hardened (rad hard) single, dual and octal devices in hermetically sealed packages and tested up to 100kRads(Si) total ionizing dose. The family includes optically coupled, buffered and non-buffered solid state relays, with input and output MOSFETs using IR HiRel’s industry-leading rad hard MOSFET technology. Customers choose our SSRs for high-reliability applications including solar array management, heater controls, bus switching, and ground power isolation.

In addition to our standard solid state relays, we also offer custom space-grade power control modules designed to customers’ specifications. Contact us with your requirements.

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HiRel Solid State Relays

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  • Base Part Status
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  • Output Current (A)
  • Response tr / tf
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Part
Package
Circuit
Response tr / tf
8-Pin SM
Form A
2
100
10
Controlled
100
8-Pin SM
Form A
2
100
10
Controlled
100
8-Pin Ceramic
Form A
2
100
1.0
Fast
100
5-Pin SM
Form A
1
60
20
Fast
100
8-Pin SM
Form A
2
100
10
Fast
100
64-Pin FlatPack
Form A
8
100
1.3
Intermediate
100
8-Pin SM
Form A
2
200
10
Controlled
100
64-Pin FlatPack
Form A
8
100
1.3
Controlled
100
22-Pin FlatPack
Form A
1
100
10
Fast
100

Quality Documents

Quality Conformance Testing

Unlike standard commercial products, HiRel products must be submitted to various levels of quality conformance testing to ensure that the products are capable of performing to specifications in the often harsh environments of military and space applications. Both the United States and European community have each developed specifications that detail the sequence of quality conformance testing.

In the United States, the Defense Logistics Agency (DLA) is the controlling agency and has issued specifications that govern the quality conformance testing sequence performed on semiconductor devices and hybrid modules, namely MIL-PRF-19500/MIL-STD-750, MIL-PRF-38534/MIL-STD-883 and MIL-PRF-38535/MIL-STD-883.

MIL-PRF-19500/MIL-STD-750 are the controlling specifications for discrete semiconductors such as diodes and power MOSFETs. MIL-PRF-19500 directs discrete semiconductors to be manufactured to either JAN, JANTX, JANTXV, or JANS levels (Note: the JAN level is not allowed for MOSFETs).

MIL-PRF-38534/MIL-STD-883 are the controlling specifications for power hybrids. MIL-STD-883 directs hybrids te be manufactured to class H or class K.

International Rectifier HiRel Products Group manufactures and tests hermetic products to one of three distinct quality conformance levels: (1) commercial hermetic, (2) source control drawing (SCD), or (3) MIL-PRF-38534, MIL-PRF-38535 qualified.

Screening and Quality Conformance Inspection Requirements

Glossary

Class H: Class H is the standard military quality level provided in MIL-PRF-38534, General Specification for Hybrid Microcircuits. It is intended for space applications.

Level B: Class level B defines the screening requirements for high reliability military applications as specified in MIL-STD-883 and is intended for use in class H products.

Level S: Class level S defines the screening requirements for high reliability space applications as specified in MIL-STD-883 and is intended for use in class K products.

JAN: JAN (Joint Army Navy) is the prefix assigned by the DLA to designate devices on the DLA qualified parts list.

JANTX: Military screening level as specified in MIL-PRF-19500 for a DLA qualified device.

JANTXV: Military with visual inspection screening level as specified in MIL-PRF-19500 for a DLA qualified device.

JANS: Space level screening as specified in MIL-PRF-19500 for a DLA qualified device.

Solid State Relays (SSR)

 
Complete HiRel Product Nomenclature

 

Single Event Effects Test Report
Product Group Date PDF
IRUH3301 Series October 2010 PDF
R7, 60V, N-Channel (Fab 2) September 2009 PDF
R7, 60V, P-Channel (Fab 2) September 2009 PDF
R6, 100V, N-Channel (Fab 2) September 2009 PDF
R6, 150V, N-Channel (Fab 2) September 2009 PDF
R6, 200V, N-Channel (Fab 2) September 2009 PDF
R6, 250V, N-Channel (Fab 2) September 2009 PDF
R5, 30V, N-Channel (Fab 2) September 2009 PDF
R5, 30V, P-Channel (Fab 2) September 2009 PDF
R5, 60V, N-Channel (Fab 2) September 2009 PDF
R5, 60V, P-Channel (Fab 2) September 2009 PDF
R5, 100V, N-Channel (Fab 2) September 2009 PDF
R5, 130V, N-Channel (Fab 2) September 2009 PDF
R5, 200V, N-Channel (Fab 2) September 2009 PDF
R5, 200V, P-Channel (Fab 2) September 2009 PDF
R5, 250V, N-Channel (Fab 2) September 2009 PDF
RDHA701FP10A8QK June 2009 PDF
R6, 600V, N-Channel March 2006 PDF
IRUH33PA13B20K December 2005 PDF
IRUH33P253B1M December 2005 PDF
S Series July 2003 PDF
Logic-Gate R7, 60V, N-Channel
R6, 100V N-Channel
R5 130V, N-Channel, SEE Process, Depletion
May 2003 PDF
Logic Gate R7, 60V, P-Channel
R5, 60V, P-Channel
November 2002 PDF
G4, 550V, N-Channel, SEE Process June 2001 PDF
RIC7113 January 2000 PDF
G4, 30V, N-Channel
G4, 100V, N-Channel
G4, 60V, P-Channel
G4, 100V, P-Channel
G4, 200V, P-Channel
G4, 400V, N-Channel, SEE Process
June 1998 PDF
G4, 30V, N-Channel
G4, 200V, N-Channel
G4, 200V, N-Channel, SEE Process
G4, 250V, N-Channel, SEE Process
G4, 400V, N-Channel, SEE Process
G4, 500V, N-Channel, SEE Process
February 1998 PDF

 

Total Ionizing Dose Test Report
Product Group PDF
IRUH3301* PDF
IRUH3301* (ELDRS Test Report) PDF
IRUH33PA13B20K PDF
IRUH33PA13B20K (ELDRS Test Report) PDF
IRUH33P253B1M PDF
IRUH33P253B1M (Low Dose Report) PDF
RDHA701CD10A2NK PDF
RDHA701FP10A8CK PDF
RDHA701FP10A8QK PDF
RDHA710FR10A1NK PDF
RDHA710SE10A2QK PDF
RIC7113 PDF
Prompt Dose Results
Product Group PDF
IRHNA57064 PDF
IRHNJ57130 PDF

 

Neutron Testing Results
Product Group PDF
IRUH3301* PDF
IRH7250 PDF
IRH57260 PDF
IRH67260 PDF
IRUH33P253B1M PDF
IRUH33PA13B20K PDF
RDHA701CD10A2NK PDF
RDHA701FP10A8QK PDF
RDHA710FR10A1NK PDF
RDHA710SE10A2F PDF
RDHA710SE10A2S PDF

 

More Reports
Product Group Report Name PDF
ART2800 TID, SEE and Neutron Report PDF
R5 MOSFET Proton Test Report PDF
RDHA710SE10A2QK Proton Test Report PDF