Single P-Channel Rad-Hard MOSFETs

Rad-Hard P-Channel MOSFETs rated from -30V to -200V in a wide range of packages.

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Single P-Channel Rad-Hard MOSFETs

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  • Circuit
  • Die Size
  • DLA Qualified
  • Forward Voltage Max
  • ID @ 100C (A)
  • Optional Total Dose Ratings
  • Polarity
  • Power Dissipation (W)
  • Total Dose
  • Total Inductance
  • Halogen-Free
  • Technology
  • ESD Class
  • ESD Voltage Range
  • Part
  • JEDEC Part Number
  • BVDSS
  • ID @ 25C (A)
  • RDS(on) @ 25C (pre-Irradiation)
  • Package
  • Base Part Status
  • Generation
Part
JEDEC Part Number
BVDSS
-30
-200
Package
Base Part Status
Generation
-100
-11
0.3
TO-254AA
Active
R4
2N7422
-100
-22
0.08
TO-254AA
Active
R4
-100
-47
0.049
SMD-2
Active
R5
-100
-6.7
0.24
TO-205AF
Active
R5
2N7625T3
-60
-20
0.072
TO-257AA Low Ohmic
Active
R7
2N7389
-100
-6.5
0.3
TO-205AF
Active
R4
2N7426
-200
-27
0.160
TO-254AA
Active
R4
2N7520U3
-60
-22
0.085
SMD-0.5
Active
R5
-100
-2.6
1.0
TO-205AF
Active
R5
2N7659T3
-60
-30
0.046
TO-257AA Low Ohmic
Active
R9
2N7550D1
-100
-45
0.05
TO-254AA Tabless SMD
Active
R5
-100
-11
0.29
SMD-0.5
Active
R4
-200
-14
0.315
TO-204AE
Pending
R4
2N7626UBC
-60
-0.53
1.3
UBC
Active
R7
2N7425U
-100
-38
0.068
SMD-2
Active
R4
2N7550U2
-100
-47
0.049
SMD-2
Active
R5
-100
-22
0.075
TO-204AE
Active
R4
2N7626UB
-60
-0.53
1.3
UB
Active
R7
-60
-20
0.087
TO-257AA Tabless Low Ohmic
Active
R5
2N7383
-200
-6.5
0.8
TO-257AA
Active
R4
-200
-6.5
0.8
SMD-0.5
Active
R4
2N7382
-100
-11
0.3
TO-257AA
Active
R4
-30
-20
0.048
TO-257AA Tabless Low Ohmic
Active
R5
2N7519T3
-30
-20
0.072
TO-257AA Low Ohmic
Active
R5
2N7426U
-200
-29
0.154
SMD-2
Active
R4
2N7624U3
-60
-22
0.072
SMD-0.5
Active
R7
2N7390U
-200
-4.0
0.8
18-pin LCC
Active
R4
2N7549T1
-200
-32
0.103
TO-254AA Low Ohmic
Active
R5
2N7550U2A
-100
-47
0.049
SupIR-SMD
Active
R5
-100
-2.3
1.1
18-pin LCC
Active
R4
2N7545U3
-100
-12.5
0.205
SMD-0.5
Active
R5
2N7389U
-100
-6.5
0.3
18-pin LCC
Active
R4
2N7547T3
-100
-12.5
0.215
TO-257AA
Active
R5
2N7524U2A
-60
-56
0.016
SupIR-SMD
Active
R5
-200
-33.5
0.102
SMD-2
Active
R5
2N7423U
-200
-14
0.315
SMD-1
Active
R4
2N7422U
-100
-22
0.08
SMD-1
Active
R4
-200
-6.5
0.8
TO-254AA
Call Factory
R4
2N7424
-60
-35
0.05
TO-254AA
Active
R4
2N7524T1
-60
-45
0.016
TO-254AA Low Ohmic
Active
R5
2N7659D5
-60
-30
0.046
TO-257AA Tabless Low Ohmic
Preliminary
R9
2N7631T2
-60
-1.6
1.2
TO-205AF
Active
R7
2N7523U2A
-30
-56
0.013
SupIR-SMD
Active
R5
2N7523T1
-30
-45
0.014
TO-254AA Low Ohmic
Active
R5
2N7390
-200
-4
0.8
TO-205AF
Active
R4
2N7548T3
-200
-8.0
0.55
TO-257AA
Active
R5
2N7424U
-60
-48
0.045
SMD-2
Active
R4
-100
-45
0.05
TO-254AA Tabless SMD
Active
R5
-100
-11
0.3
TO-204AA
Pending
R4
-60
-18
0.095
TO-257AA
Active
R5
-60
-45
0.018
TO-254AA Low Ohmic
Active
R7
2N7549U2
-200
-35.5
0.102
SMD-2
Active
R5
2N7622U2
-60
-56.0
0.015
SMD-2
Active
R7
-200
-4.5
0.54
TO-205AF
Active
R5
-100
-12.5
0.205
SMD-0.5
Active
R5
2N7520T3
-60
-20
0.087
TO-257AA Low Ohmic
Active
R5
2N7550T1
-100
-45
0.049
TO-254AA Low Ohmic
Active
R5
-200
-6
0.8
TO-204AA
Pending
R4
2N7425
-100
-35
0.073
TO-254AA
Active
R4
-100
-11
0.3
SMD-1
Call Factory
R4
2N7423
-200
-14
0.315
TO-254AA
Active
R4
2N7524D4
-60
-45
0.018
TO-254AA Tabless Low Ohmic
Active
R5
2N7506U8
-100
-3.1
1.2
SMD-0.2
Active
R5
2N7549U2A
-200
-33.5
0.102
SupIR-SMD
Active
R5
2N7524U2
-60
-56.0
0.015
SMD-2
Active
R5
2N7546U3
-200
-8.0
0.505
SMD-0.5
Active
R5
2N7519U3
-30
-22
0.070
SMD-0.5
Active
R5
2N7523U2
-30
-56.0
0.013
SMD-2
Active
R5

Quality Documents


Quality Conformance Testing

Unlike standard commercial products, HiRel products must be submitted to various levels of quality conformance testing to ensure that the products are capable of performing to specifications in the often harsh environments of military and space applications. Both the United States and European community have each developed specifications that detail the sequence of quality conformance testing.

In the United States, the Defense Logistics Agency (DLA) is the controlling agency and has issued specifications that govern the quality conformance testing sequence performed on semiconductor devices and hybrid modules, namely MIL-PRF-19500/MIL-STD-750, MIL-PRF-38534/MIL-STD-883 and MIL-PRF-38535/MIL-STD-883.

MIL-PRF-19500/MIL-STD-750 are the controlling specifications for discrete semiconductors such as diodes and power MOSFETs. MIL-PRF-19500 directs discrete semiconductors to be manufactured to either JAN, JANTX, JANTXV, or JANS levels (Note: the JAN level is not allowed for MOSFETs).

International Rectifier HiRel Products Group manufactures and tests hermetic products to one of three distinct quality conformance levels: (1) commercial hermetic, (2) source control drawing (SCD), or (3) MIL-PRF-38534, MIL-PRF-38535 qualified.

Screening and Quality Conformance Inspection Requirements

* - Beryllia warning per MIL-PRF-19500
Packages TO-254, TO-257, TO-258, TO-259 contain beryllium oxide (beryllia). Devices containing BeO are marked with designation “BeO” as per MIL-PRF-19500.
 
QPL Listing - Discretes

Glossary

Class H: Class H is the standard military quality level provided in MIL-PRF-38534, General Specification for Hybrid Microcircuits. It is intended for space applications.

Level B: Class level B defines the screening requirements for high reliability military applications as specified in MIL-STD-883 and is intended for use in class H products.

Level S: Class level S defines the screening requirements for high reliability space applications as specified in MIL-STD-883 and is intended for use in class K products.

JAN: JAN (Joint Army Navy) is the prefix assigned by the DLA to designate devices on the DLA qualified parts list.

JANTX: Military screening level as specified in MIL-PRF-19500 for a DLA qualified device.

JANTXV: Military with visual inspection screening level as specified in MIL-PRF-19500 for a DLA qualified device.

JANS: Space level screening as specified in MIL-PRF-19500 for a DLA qualified device.

HiRel Part Number Definition

Click on the appropriate link below for assistance in ordering the correct part number:

 

 

Complete HiRel Product Nomenclature

 

Single Event Effects Test Report
Product Group Date PDF
RIC7S113 May 2021 PDF
IRUH3301 Series October 2010 PDF
R7, 60V, N-Channel (Fab 2) September 2009 PDF
R7, 60V, P-Channel (Fab 2) September 2009 PDF
R6, 100V, N-Channel (Fab 2) September 2009 PDF
R6, 150V, N-Channel (Fab 2) September 2009 PDF
R6, 200V, N-Channel (Fab 2) September 2009 PDF
R6, 250V, N-Channel (Fab 2) September 2009 PDF
R5, 30V, N-Channel (Fab 2) September 2009 PDF
R5, 30V, P-Channel (Fab 2) September 2009 PDF
R5, 60V, N-Channel (Fab 2) September 2009 PDF
R5, 60V, P-Channel (Fab 2) September 2009 PDF
R5, 100V, N-Channel (Fab 2) September 2009 PDF
R5, 130V, N-Channel (Fab 2) September 2009 PDF
R5, 200V, N-Channel (Fab 2) September 2009 PDF
R5, 200V, P-Channel (Fab 2) September 2009 PDF
R5, 250V, N-Channel (Fab 2) September 2009 PDF
RDHA701FP10A8QK June 2009 PDF
R6, 600V, N-Channel March 2006 PDF
IRUH33PA13B20K December 2005 PDF
IRUH33P253B1M December 2005 PDF
S Series July 2003 PDF
Logic-Gate R7, 60V, N-Channel
R6, 100V N-Channel
R5 130V, N-Channel, SEE Process, Depletion
May 2003 PDF
Logic Gate R7, 60V, P-Channel
R5, 60V, P-Channel
November 2002 PDF
G4, 550V, N-Channel, SEE Process June 2001 PDF
G4, 30V, N-Channel
G4, 100V, N-Channel
G4, 60V, P-Channel
G4, 100V, P-Channel
G4, 200V, P-Channel
G4, 400V, N-Channel, SEE Process
June 1998 PDF
G4, 30V, N-Channel
G4, 200V, N-Channel
G4, 200V, N-Channel, SEE Process
G4, 250V, N-Channel, SEE Process
G4, 400V, N-Channel, SEE Process
G4, 500V, N-Channel, SEE Process
February 1998 PDF

 

Total Ionizing Dose Test Report
Product Group PDF
IRUH3301* PDF
IRUH3301* (ELDRS Test Report) PDF
IRUH33PA13B20K PDF
IRUH33PA13B20K (ELDRS Test Report) PDF
IRUH33P253B1M PDF
IRUH33P253B1M (Low Dose Report) PDF
RDHA701CD10A2NK PDF
RDHA701FP10A8CK PDF
RDHA701FP10A8QK PDF
RDHA710FR10A1NK PDF
RDHA710SE10A2QK PDF
RIC7S113 PDF
Prompt Dose Results
Product Group PDF
IRHNA57064 PDF
IRHNJ57130 PDF

 

Neutron Testing Results
Product Group PDF
IRUH3301* PDF
IRH7250 PDF
IRH57260 PDF
IRH67260 PDF
IRUH33P253B1M PDF
IRUH33PA13B20K PDF
RDHA701CD10A2NK PDF
RDHA701FP10A8QK PDF
RDHA710FR10A1NK PDF
RDHA710SE10A2F PDF
RDHA710SE10A2S PDF

 

More Reports
Product Group Report Name PDF
Radiation Test FAQs Application Note: AN-1228 PDF
R5 MOSFET Proton Test Report PDF
RDHA710SE10A2QK Proton Test Report PDF