| Single Event Effects Test Report |
| Product Group |
Date |
PDF |
| IRUH3301 Series |
October 2010 |
PDF |
| R7, 60V, N-Channel (Fab 2) |
September 2009 |
PDF |
| R7, 60V, P-Channel (Fab 2) |
September 2009 |
PDF |
| R6, 100V, N-Channel (Fab 2) |
September 2009 |
PDF |
| R6, 150V, N-Channel (Fab 2) |
September 2009 |
PDF |
| R6, 200V, N-Channel (Fab 2) |
September 2009 |
PDF |
| R6, 250V, N-Channel (Fab 2) |
September 2009 |
PDF |
| R5, 30V, N-Channel (Fab 2) |
September 2009 |
PDF |
| R5, 30V, P-Channel (Fab 2) |
September 2009 |
PDF |
| R5, 60V, N-Channel (Fab 2) |
September 2009 |
PDF |
| R5, 60V, P-Channel (Fab 2) |
September 2009 |
PDF |
| R5, 100V, N-Channel (Fab 2) |
September 2009 |
PDF |
| R5, 130V, N-Channel (Fab 2) |
September 2009 |
PDF |
| R5, 200V, N-Channel (Fab 2) |
September 2009 |
PDF |
| R5, 200V, P-Channel (Fab 2) |
September 2009 |
PDF |
| R5, 250V, N-Channel (Fab 2) |
September 2009 |
PDF |
| RDHA701FP10A8QK |
June 2009 |
PDF |
| R6, 600V, N-Channel |
March 2006 |
PDF |
| IRUH33PA13B20K |
December 2005 |
PDF |
| IRUH33P253B1M |
December 2005 |
PDF |
| S Series |
July 2003 |
PDF |
Logic-Gate R7, 60V, N-Channel
R6, 100V N-Channel
R5 130V, N-Channel, SEE Process, Depletion |
May 2003 |
PDF |
Logic Gate R7, 60V, P-Channel
R5, 60V, P-Channel |
November 2002 |
PDF |
| G4, 550V, N-Channel, SEE Process |
June 2001 |
PDF |
| RIC7113 |
January 2000 |
PDF |
G4, 30V, N-Channel
G4, 100V, N-Channel
G4, 60V, P-Channel
G4, 100V, P-Channel
G4, 200V, P-Channel
G4, 400V, N-Channel, SEE Process |
June 1998 |
PDF |
G4, 30V, N-Channel
G4, 200V, N-Channel
G4, 200V, N-Channel, SEE Process
G4, 250V, N-Channel, SEE Process
G4, 400V, N-Channel, SEE Process
G4, 500V, N-Channel, SEE Process |
February 1998 |
PDF |
|