DirectFET® MOSFET: Mechanical Testing
|
Substrate Bend Testing
- Curve tracer was used to monitor the gate, looking for: gate leakage, open or short circuit
- For the capacitors a capacitance meter was used to look for +/-20% shift in capacitance
|
|
|
"Play Audio
|
Substrate Bend Test Measurements
Ceramic Capacitors:
- Notorious for board attach strength problems
- DirectFET technology has similar appearance
- DirectFET technology more than doubles the board deflection capability before failing, in respect to the ceramic capacitor
|
|
Vibration Testing
- Tests carried out in accordance with
BS 2011:Part 2.1Fd
“Random Vibration – wide band general requirements”
specifications.
- 3hrs testing showed 0/16 fails at each attitude
|
|
Drop/Shock Testing
|
Compression Testing
|
 |
IR’s proprietary DirectFET® technology is covered by US Patent 6,624,522 and
other US and foreign pending patent applications.
|
|
|
