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Die Testing
IR can offer a multitude of different testing options, to meet our customers commercial and Technical needs.
Die Testing Options
- Probed Die
- Die probed to the same probe level that IR uses for package products. Note: IR also offers "Probed Die with special screened parameter" which allows for the screening of a particular parameter.
- Known Good Die (KGD)
- Die probe after wafer saw to the parameters given in the package part datasheet
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