MIL-PRF-19500 covers screening requirements that all parts are submitted to as well as Quality Conformance inspection consisting of one or more of Group A, B, C, D and E for acceptance of the design of the process and of the production lot.
MIL-PRF-19500 applies to discrete components such as MOSFETs and Schottkys. QPL discrete components have been qualified per MIL-PRF-19500.
For more information on MIL-PRF-19500 screening and quality conformance inspection, consult the DoD document or contact factory.
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MIL-PRF-19500 Screening Requirements |
Test/Inspection |
Screening Level |
MIL-STD-750
Method |
JANTX |
JANTXV |
JANS |
Internal visual inspection (precap) |
- |
100% |
100% |
2073, 2074, 2072 |
Temperature cycling (temp. cycle)
20 cycles > 10 minutes @
temperature extremes |
100% |
100% |
100% |
1051 |
Thermal impedance |
100% |
100% |
100% |
3161, 3101, 3103 |
Constant acceleration 20kG or 10kG > 10W |
- |
- |
100% |
2006 |
Particle impact noise detection
(PIND - devices with internal cav.) |
- |
- |
100% |
2052
Condition A |
Serialization of devices |
- |
- |
100% |
|
Interim electrical parameters |
- |
- |
100%
R&R |
|
High temperature gate bias
(within x hrs)
MOSFETs/IGBTs: |
100%
(48 hrs) |
100%
(48 hrs) |
100%
(48 hrs) |
1042
Condition B |
Interim electrical
and delta parameters
(within x hrs) |
100%
(24 hrs) |
100%
(24 hrs) |
100%
(16 hrs) |
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High temperature reverse bias
(hours minimum)
MOSFETs/IGBTs:
Diodes: |
100%
(160 hrs)
100%
(96 hrs) |
100%
(160 hrs)
100%
(96 hrs) |
100%
(240 hrs)
100%
(240 hrs) |
1042
Condition A
1038
Condition A |
Final electrical test
and delta parameters |
100% |
100% |
100% |
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Hermetic seal (fine and gross leak) |
100% |
100% |
100% |
1071 |
Radiography |
- |
- |
100% |
2076 |
External visual exam
(after complete marking) |
- |
- |
100% |
2071 |
Case Isolation
(Case Isolated Packages) |
100% |
100% |
100% |
1081 |
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MIL-PRF-19500 Quality Conformance Inspection
MIL-PRF-19500 Group A Inspection
Electrical Verification |
Sub
Group |
Parameters |
JANS
Quantity
(accept number) |
JANTX, JANTXV
Quantity
(accept number) |
1 |
Visual and mechanical inspection |
15 (0) |
45 (0) |
2 |
DC (static) test at +25°C |
116 (0) |
116 (0) |
3 |
DC (static) tests at max. and min. temps. |
4 |
Dynamic tests at +25°C |
5 |
Safe operating area test (power trans.):
a. DC
b. Clamped inductive
c. Unclamped inductive
End point electrical measurements |
45 (0) |
45 (0) |
6 |
Surge current (diodes and rectifiers)
End point electrical measurements |
22 (0) |
7 |
Selected static and dynamic tests |
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MIL-PRF-19500 Group B Inspection
Mechanical Verification (JANS) |
Sub
Group |
Parameters |
JANS, Large Lot
Quantity
(accept number) |
JANS, Small Lot
Quantity
(accept number) |
1 |
Physical dimensions |
22 (0) |
8 (0) |
2 |
Solderability |
15 leads (0) |
6 leads (0) |
Resistance to solvents |
15 (0) |
6 (0) |
3 |
Temperature cycling (100 cycles) |
22 (0) |
6 (0) |
Surge (diodes only) |
Hermetic seal (fine and gross leak) |
Electrical measurements |
Decap internal visual |
6 (0) |
6 (0) |
Bond strength |
22 wires (0) or 11 (0) |
12 wires (0) or 6 (0) |
SEM (when specified)* |
6 (0) |
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Die shear |
11 (0) |
6 (0) |
4 |
Intermittent op. life
Electrical measurements |
22 (0) |
12 (0) |
5 |
Accelerated HTRB (120 hours) |
22 (0) |
12 (0) |
Electrical measurements |
Accelerated HTGB (24 hrs) |
Electrical measurements |
Bond strength |
22 wires (0) |
20 wires (0) |
6 |
Thermal resistance |
22 (0) |
12 (0) |
7 |
High Temp Life (340 Hours Non-Operating) |
32 (0) |
12 (0) |
Electrical |
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*Note: Not applicable for Schottky's |
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MIL-PRF-19500 Group B Inspection
Mechanical Verification(JANTX, JANTXV) |
Sub
Group |
Parameters |
JANTX, JANTXV
Large Lot
Quantity
(accept number) |
JANTX, JANTXV
Small Lot
Quantity
(accept number) |
1 |
Solderability |
15 leads (0) |
4 leads (0) |
Resistance to solvents |
15 (0) |
3 (0) |
2 |
Temperature cycling
(45 cycles, including screening) |
22 (0) |
6 (0) |
Thermal shock (10 cycles) |
Hermetic seal (fine and gross leak) |
Electrical measurements |
3 |
Steady state op. life or
intermittent op. life |
45 (0) |
12 (0) |
Electrical measurements |
Bond strength |
11 wires (0) |
11 wires (0) |
4 |
Decap internal visual |
1 (0) |
1 (0) |
5 |
Thermal resistance (Performed 100%) |
15 (0) |
6 (0) |
6 |
High temperature life (340 hours) non-operating* |
32 (0) |
12 (0) |
Electrical measurements |
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*Note: Not applicable for power MOSFETs |
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MIL-PRF-19500 Group C Inspection
Long-term Reliability Verification |
Sub
Group |
Parameters |
All Quality Levels
Large Lot
Quantity
(accept number) |
All Quality Levels
Small Lot
Quantity
(accept number) |
1 |
Physical dimensions |
15 (0) |
6 (0) |
2 |
Thermal shock |
22 (0) |
6 (0) |
Terminal strength |
Hermetic seal (fine and gross leak) |
Moisture resistance |
Electrical measurements |
3 |
Shock |
22 (0) |
6 (0) |
Vibration, variable frequency |
Constant acceleration |
Electrical measurements |
4 |
Salt atmosphere (corrosion) |
15 (0) |
6 (0) |
5 |
N/A |
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6 |
Steady state op. life or
intermittent op. life or blocking life |
22 (0) |
12 (0) |
Electrical measurements |
7 |
Internal water vapor |
3 (0) |
3 (0) |
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MIL-PRF-19500 Group D Inspection
Radiation Hardness Assurance Program |
Sub
Group |
Parameters |
JANTXV
Inspection Lot
Quantity
(accept number) |
JANS Wafer
Inspection Lot
Quantity
(accept number) |
2 |
Steady-state total dose irradiation |
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Qualification |
11 (0) |
4 (0) See note 1.
2 (0) See note 2.
1 (0) See note 3. |
CI |
11 (0) |
4 (0) See note 1.
2 (0) See note 2.
1 (0) See note 3. |
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1. For device types ≥ 4,000 die per wafer
2. For device types > 500 and < 4,000 die per wafer
3. For device types ≤ 500 die per wafer |
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MIL-PRF-19500 Group E Inspection
Package Qualification |
Sub
Group |
Parameters |
All Quality Levels
Quantity
(accept number) |
1 |
Thermal shock (100 cycles)
or
Temp. cycling (500 cycles min.)
Electrical Measurements |
per MIL-PRF-19500 |
2 |
Steady state op. life
Electrical measurements |
per MIL-PRF-19500 |
4 |
Thermal resistance |
22 (0) |
5 |
Barometric pressure
(derives with rated voltage > 200V |
15 (0) |
6 |
ESD |
3 (0) |
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