MIL-PRF-19500 Screening and Quality Conformance Inspection Requirements

 

MIL-PRF-19500 covers screening requirements that all parts are submitted to as well as Quality Conformance inspection consisting of one or more of Group A, B, C, D and E for acceptance of the design of the process and of the production lot.

MIL-PRF-19500 applies to discrete components such as MOSFETs and Schottkys. QPL discrete components have been qualified per MIL-PRF-19500.

 
MIL-PRF-19500 Screening Requirements
Test/Inspection Screening Level MIL-STD-750
Method
JANTX JANTXV JANS
Internal visual inspection (precap) - 100% 100% 2073, 2074, 2072
Temperature cycling (temp. cycle)
20 cycles > 10 minutes @
temperature extremes
100% 100% 100% 1051
Thermal impedance 100% 100% 100% 3161, 3101, 3103
Constant acceleration 20kG or 10kG > 10W - - 100% 2006
Particle impact noise detection
(PIND - devices with internal cav.)
- - 100% 2052
Condition A
Serialization of devices - - 100%  
Interim electrical parameters - - 100%
R&R
 
High temperature gate bias
(within x hrs)
MOSFETs/IGBTs:
100%
 
(48 hrs)
100%
 
(48 hrs)
100%
 
(48 hrs)
1042
Condition B
Interim electrical
and delta parameters
(within x hrs)
100%
 
(24 hrs)
100%
 
(24 hrs)
100%
 
(16 hrs)
 
High temperature reverse bias
(hours minimum)
MOSFETs/IGBTs:
 
Diodes:
 
 
100%
(160 hrs)
100%
(96 hrs)
 
 
100%
(160 hrs)
100%
(96 hrs)
 
 
100%
(240 hrs)
100%
(240 hrs)
 
 
1042
Condition A
1038
Condition A
Final electrical test
and delta parameters
100% 100% 100%  
Hermetic seal (fine and gross leak) 100% 100% 100% 1071
Radiography - - 100% 2076
External visual exam
(after complete marking)
- - 100% 2071
Case Isolation
(Case Isolated Packages)
100% 100% 100% 1081

 

 

MIL-PRF-19500 Quality Conformance Inspection

MIL-PRF-19500 Group A Inspection
Electrical Verification
Sub
Group
Parameters JANS
Quantity
(accept number)
JANTX, JANTXV
Quantity
(accept number)
1 Visual and mechanical inspection 15 (0) 45 (0)
2 DC (static) test at +25°C 116 (0) 116 (0)
3 DC (static) tests at max. and min. temps.
4 Dynamic tests at +25°C
5 Safe operating area test (power trans.):
   a. DC
   b. Clamped inductive
   c. Unclamped inductive
End point electrical measurements
45 (0) 45 (0)
6 Surge current (diodes and rectifiers)
End point electrical measurements
22 (0)
7 Selected static and dynamic tests

 

 

MIL-PRF-19500 Group B Inspection
Mechanical Verification
(JANS)
Sub
Group
Parameters JANS, Large Lot
Quantity
(accept number)
JANS, Small Lot
Quantity
(accept number)
1 Physical dimensions 22 (0) 8 (0)
2 Solderability 15 leads (0) 6 leads (0)
Resistance to solvents 15 (0) 6 (0)
3 Temperature cycling (100 cycles) 22 (0) 6 (0)
Surge (diodes only)
Hermetic seal (fine and gross leak)
Electrical measurements
Decap internal visual 6 (0) 6 (0)
Bond strength 22 wires (0) or 11 (0) 12 wires (0) or 6 (0)
SEM (when specified)* 6 (0)  
Die shear 11 (0) 6 (0)
4 Intermittent op. life
Electrical measurements
22 (0) 12 (0)
5 Accelerated HTRB (120 hours) 22 (0) 12 (0)
Electrical measurements
Accelerated HTGB (24 hrs)
Electrical measurements
Bond strength 22 wires (0) 20 wires (0)
6 Thermal resistance 22 (0) 12 (0)
7 High Temp Life (340 Hours Non-Operating) 32 (0) 12 (0)
Electrical
*Note: Not applicable for Schottky's

 

 

MIL-PRF-19500 Group B Inspection
Mechanical Verification
(JANTX, JANTXV)
Sub
Group
Parameters JANTX, JANTXV
Large Lot
Quantity
(accept number)
JANTX, JANTXV
Small Lot
Quantity
(accept number)
1 Solderability 15 leads (0) 4 leads (0)
Resistance to solvents 15 (0) 3 (0)
2 Temperature cycling
(45 cycles, including screening)
22 (0) 6 (0)
Thermal shock (10 cycles)
Hermetic seal (fine and gross leak)
Electrical measurements
3 Steady state op. life or
intermittent op. life
45 (0) 12 (0)
Electrical measurements
Bond strength 11 wires (0) 11 wires (0)
4 Decap internal visual 1 (0) 1 (0)
5 Thermal resistance (Performed 100%) 15 (0) 6 (0)
6 High temperature life (340 hours) non-operating* 32 (0) 12 (0)
Electrical measurements
*Note: Not applicable for power MOSFETs

 

 

MIL-PRF-19500 Group C Inspection
Long-term Reliability Verification
Sub
Group
Parameters All Quality Levels
Large Lot
Quantity
(accept number)
All Quality Levels
Small Lot
Quantity
(accept number)
1 Physical dimensions 15 (0) 6 (0)
2 Thermal shock 22 (0) 6 (0)
Terminal strength
Hermetic seal (fine and gross leak)
Moisture resistance
Electrical measurements
3 Shock 22 (0) 6 (0)
Vibration, variable frequency
Constant acceleration
Electrical measurements
4 Salt atmosphere (corrosion) 15 (0) 6 (0)
5 N/A    
6 Steady state op. life or
intermittent op. life or blocking life
22 (0) 12 (0)
Electrical measurements
7 Internal water vapor 3 (0) 3 (0)

 

 

MIL-PRF-19500 Group D Inspection
Radiation Hardness Assurance Program
Sub
Group
Parameters JANTXV
Inspection Lot
Quantity
(accept number)
JANS Wafer
Inspection Lot
Quantity
(accept number)
2 Steady-state total dose irradiation    
Qualification 11 (0) 4 (0) See note 1.
2 (0) See note 2.
1 (0) See note 3.
CI 11 (0) 4 (0) See note 1.
2 (0) See note 2.
1 (0) See note 3.
1. For device types ≥ 4,000 die per wafer
2. For device types > 500 and < 4,000 die per wafer
3. For device types ≤ 500 die per wafer

 

 

MIL-PRF-19500 Group E Inspection
Package Qualification
Sub
Group
Parameters All Quality Levels
Quantity
(accept number)
1 Thermal shock (100 cycles)
or
Temp. cycling (500 cycles min.)
Electrical Measurements
per MIL-PRF-19500
2 Steady state op. life
Electrical measurements
per MIL-PRF-19500
4 Thermal resistance 22 (0)
5 Barometric pressure
(derives with rated voltage > 200V
15 (0)
6 ESD 3 (0)

For more information on MIL-PRF-19500 screening and quality conformance inspection, consult the DoD document or contact factory [include e-mail address to IRLM customer service]